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Results: 1-11 |
Results: 11

Authors: CARPENTER EOS FARR JPG
Citation: Eos. Carpenter et Jpg. Farr, CHARACTERIZATION OF ZINC-COBALT ELECTRODEPOSITS, Transactions of the Institute of Metal Finishing, 76, 1998, pp. 135-143

Authors: FARR JPG
Citation: Jpg. Farr, APPLIED ELECTROCHEMICAL RESEARCH RELATING TO MATERIALS FINISHING AT BIRMINGHAM-UNIVERSITY, Transactions of the Institute of Metal Finishing, 76, 1998, pp. 3-3

Authors: LANSDELL P FARR JPG
Citation: P. Lansdell et Jpg. Farr, THE CORROSION-RESISTANCE OF CHROMIUM ELECTROPLATED FROM TRIVALENT ANDHEXAVALENT CHROMIUM PLATING SOLUTIONS, Transactions of the Institute of Metal Finishing, 75, 1997, pp. 219-223

Authors: TONG XQ AINDOW M FARR JPG
Citation: Xq. Tong et al., INSTRUMENTAL EFFECTS ON IN-SITU ELECTROCHEMICAL STM STUDIES - AN INVESTIGATION OF A CURRENT SURGE INDUCED PD DEPOSIT ON HOPG, Microscopy research and technique, 34(1), 1996, pp. 87-95

Authors: FARR JPG NOSHANI AA
Citation: Jpg. Farr et Aa. Noshani, SOME PROPERTIES OF ELECTROLESS NI-P, CO-P, AND NI-CO-P DEPOSITS, Transactions of the Institute of Metal Finishing, 74, 1996, pp. 221-225

Authors: GERING J FARR JPG
Citation: J. Gering et Jpg. Farr, THE EFFECT OF BRUSH-PLATING ON THE STRUCTURE AND WEAR PROPERTIES OF ELECTRODEPOSITS, Transactions of the Institute of Metal Finishing, 74, 1996, pp. 226-232

Authors: TONG XQ AINDOW M FARR JPG
Citation: Xq. Tong et al., A STUDY OF THE PD HIGHLY ORIENTED PYROLYTIC-GRAPHITE ELECTRODEPOSITION SYSTEM BY IN-SITU ELECTROCHEMICAL SCANNING-TUNNELING-MICROSCOPY, Journal of electroanalytical chemistry [1992], 395(1-2), 1995, pp. 117-126

Authors: GERING J BELL T FARR JPG MOUNTFORD R RYAN J
Citation: J. Gering et al., STRUCTURE AND WEAR-RESISTANCE OF BRUSH PLATED NICKEL, Transactions of the Institute of Metal Finishing, 73, 1995, pp. 82-84

Authors: ASHIRU OA FARR JPG
Citation: Oa. Ashiru et Jpg. Farr, APPLICATION OF FREQUENCY-RESPONSE ANALYSIS TO THE DETERMINATION OF CATHODIC DISCHARGE MECHANISM DURING SILVER ELECTROPLATING, Journal of the Electrochemical Society, 142(11), 1995, pp. 3729-3734

Authors: BRIGGS MC EARWAKER LG NASIR MI FARR JPG KEEN JM ANDERSON DG ANWAR N AYLETT BJ
Citation: Mc. Briggs et al., MICROANALYSIS OF MOCVD TREATED POROUS SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 77(1-4), 1993, pp. 362-368

Authors: ASHIRU OA FARR JPG STREET J
Citation: Oa. Ashiru et al., WHAT CHANCE THE ELIMINATION OF CYANIDE, Transactions of the Institute of Metal Finishing, 69, 1991, pp. 8-10
Risultati: 1-11 |