Authors:
HOOGEMAN MS
VANLOON DG
LOOS RWM
FICKE HG
DEHAAS E
VANDERLINDEN JJ
ZEIJLEMAKER H
KUIPERS L
CHANG MF
KLIK MAJ
FRENKEN JWM
Citation: Ms. Hoogeman et al., DESIGN AND PERFORMANCE OF A PROGRAMMABLE-TEMPERATURE SCANNING TUNNELING MICROSCOPE, Review of scientific instruments, 69(5), 1998, pp. 2072-2080
Citation: Pb. Rasmussen et al., THE REACTOR STM - A SCANNING TUNNELING MICROSCOPE FOR INVESTIGATION OF CATALYTIC SURFACES AT SEMIINDUSTRIAL REACTION CONDITIONS, Review of scientific instruments, 69(11), 1998, pp. 3879-3884
Citation: Wj. Huisman et al., A NEW X-RAY-DIFFRACTION METHOD FOR STRUCTURAL INVESTIGATIONS OF SOLID-LIQUID INTERFACES, Review of scientific instruments, 68(11), 1997, pp. 4169-4176