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Results:
1-7
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Results: 7
Authors:
PRESSEL K
FISCHER GG
ZAUMSEIL P
KIM M
OSTEN HJ
Citation: K. Pressel et al., INFRARED-SPECTROSCOPY OF STRAINED SI1-YCY ALLOYS SS-THAN-OR-EQUAL-TO-Y-LESS-THAN-OR-EQUAL-TO-0.015) GROWN ON SILICON, Thin solid films, 294(1-2), 1997, pp. 133-136
Authors:
FISCHER GG
ZAUMSEIL P
Citation: Gg. Fischer et P. Zaumseil, SIMULATION OF THE PROCESS OF STRAIN RELAXATION IN SI1-XGEX SI(100) HETEROSTRUCTURES/, Physica status solidi. a, Applied research, 164(2), 1997, pp. 767-778
Authors:
ZAUMSEIL P
FISCHER GG
BRUNNER K
EBERL K
Citation: P. Zaumseil et al., COMPARISON OF THE THERMAL-STABILITY OF SI0.603GE0.397 SI AND SI0.597GE0.391C0.012/SI SUPERLATTICE STRUCTURES/, Journal of applied physics, 81(9), 1997, pp. 6134-6140
Authors:
OSTEN HJ
ENDISCH D
BUGIEL E
DIETRICH B
FISCHER GG
KIM M
KRUGER D
ZAUMSEIL P
Citation: Hj. Osten et al., STRAIN RELAXATION IN TENSILE-STRAINED SI1-YCY LAYERS ON SI(001), Semiconductor science and technology, 11(11), 1996, pp. 1678-1687
Authors:
ZAUMSEIL P
FISCHER GG
QUICK C
MISIUK A
Citation: P. Zaumseil et al., THE RELAXATION BEHAVIOR OF STRAINED SI1-XGEX LAYERS AT HIGH-TEMPERATURE UNDER HYDROSTATIC-PRESSURE, Physica status solidi. a, Applied research, 153(2), 1996, pp. 401-408
Authors:
FISCHER GG
ZAUMSEIL P
Citation: Gg. Fischer et P. Zaumseil, IN-SITU X-RAY-INVESTIGATION OF THE HIGH-TEMPERATURE BEHAVIOR OF STRAINED SI1-XGEX SI AND SI1-YCY/SI HETEROSTRUCTURES/, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 109-113
Authors:
FISCHER GG
ZAUMSEIL P
BUGIEL E
OSTEN HJ
Citation: Gg. Fischer et al., INVESTIGATION OF THE HIGH-TEMPERATURE BEHAVIOR OF STRAINED SI1-YCY SIHETEROSTRUCTURES/, Journal of applied physics, 77(5), 1995, pp. 1934-1937
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