Authors: FRANTA D OHLIDAL I

Citation: D. Franta et I. Ohlidal, ELLIPSOMETRIC PARAMETERS AND REFLECTANCES OF THIN-FILMS WITH SLIGHTLYROUGH BOUNDARIES, J. mod. opt., 45(5), 1998, pp. 903-934

Authors: FRANTA D OHLIDAL I MUNZAR D

Citation: D. Franta et al., PARAMETERIZATION OF THE MODEL OF DISPERSION DEPENDENCES OF SOLID-STATE OPTICAL-CONSTANTS, Acta physica slovaca, 48(4), 1998, pp. 451-458

Authors: OHLIDAL I FRANTA D

Citation: I. Ohlidal et D. Franta, ELLIPSOMETRY OF THIN-FILMS, Acta physica slovaca, 48(4), 1998, pp. 459-468

Authors: FRANTA D OHLIDAL I

Citation: D. Franta et I. Ohlidal, STATISTICAL PROPERTIES OF THE NEAR-FIELD SPECKLE PATTERNS OF THIN-FILMS WITH SLIGHTLY ROUGH BOUNDARIES, Optics communications, 147(4-6), 1998, pp. 349-358

Authors: OHLIDAL I FRANTA D HORA J NAVRATIL K WEBER J JANDA P

Citation: I. Ohlidal et al., ANALYSIS OF THIN-FILMS WITH SLIGHTLY ROUGH BOUNDARIES, Mikrochimica acta (1966), 1998, pp. 177-180