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Results:
1-8
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Results: 8
Authors:
JOENATHAN C
FRANZE B
HAIBLE P
TIZIANI HJ
Citation: C. Joenathan et al., LARGE INPLANE DISPLACEMENT MEASUREMENT IN DUAL-BEAM SPECKLE INTERFEROMETRY USING TEMPORAL PHASE MEASUREMENT, J. mod. opt., 45(9), 1998, pp. 1975-1984
Authors:
FRANZE B
TIZIANI HJ
Citation: B. Franze et Hj. Tiziani, MULTIPLE WAVELENGTHS IN OBLIQUE-INCIDENCE INTERFEROMETER FOR ROUGH-SURFACE MEASUREMENT USING LASER-DIODES, J. mod. opt., 45(4), 1998, pp. 861-872
Authors:
JOENATHAN C
FRANZE B
HAIBLE P
TIZIANI HJ
Citation: C. Joenathan et al., NOVEL TEMPORAL FOURIER-TRANSFORM SPECKLE PATTERN SHEARING INTERFEROMETER, Optical engineering, 37(6), 1998, pp. 1790-1795
Authors:
JOENATHAN C
FRANZE B
HAIBLE P
TIZIANI HJ
Citation: C. Joenathan et al., SHAPE MEASUREMENT BY USE OF TEMPORAL FOURIER TRANSFORMATION IN DUAL-BEAM ILLUMINATION SPECKLE INTERFEROMETRY, Applied optics, 37(16), 1998, pp. 3385-3390
Authors:
JOENATHAN C
FRANZE B
HAIBLE P
TIZIANI HJ
Citation: C. Joenathan et al., SPECKLE INTERFEROMETRY WITH TEMPORAL PHASE EVALUATION FOR MEASURING LARGE-OBJECT DEFORMATION, Applied optics, 37(13), 1998, pp. 2608-2614
Authors:
TIZIANI HJ
FRANZE B
HAIBLE P
Citation: Hj. Tiziani et al., WAVELENGTH-SHIFT SPECKLE INTERFEROMETRY FOR ABSOLUTE PROFILOMETRY USING A MODE-HOP FREE EXTERNAL-CAVITY DIODE-LASER, J. mod. opt., 44(8), 1997, pp. 1485-1496
Authors:
WINDECKER R
FLEISCHER M
FRANZE B
TIZIANI HJ
Citation: R. Windecker et al., 2 METHODS FOR FAST COHERENCE TOMOGRAPHY AND TOPOMETRY, J. mod. opt., 44(5), 1997, pp. 967-977
Authors:
JOENATHAN C
FRANZE B
TIZIANI HJ
Citation: C. Joenathan et al., OBLIQUE-INCIDENCE AND OBSERVATION ELECTRONIC SPECKLE-PATTERN INTERFEROMETRY, Applied optics, 33(31), 1994, pp. 7307-7311
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