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Results: 1-11 |
Results: 11
POROUS SILICON AS A SUBSTRATE MATERIAL FOR POTENTIOMETRIC BIOSENSORS
Authors: THUST M SCHONING MJ FROHNHOFF S ARENSFISCHER R KORDOS P LUTH H
Citation: M. Thust et al., POROUS SILICON AS A SUBSTRATE MATERIAL FOR POTENTIOMETRIC BIOSENSORS, Measurement science & technology, 7(1), 1996, pp. 26-29
SOFT-X-RAY EMISSION OF POROUS SILICON NANOSTRUCTURES
Authors: EISEBITT S LUNING J RUBENSSON JE VANBUUREN T PATITSAS SN TIEDJE T BERGER M ARENSFISCHER R FROHNHOFF S EBERHARDT W
Citation: S. Eisebitt et al., SOFT-X-RAY EMISSION OF POROUS SILICON NANOSTRUCTURES, Journal of electron spectroscopy and related phenomena, 79, 1996, pp. 135-138
QUANTUM CONFINEMENT EFFECTS IN THE SOFT-X-RAY FLUORESCENCE-SPECTRA OFPOROUS SILICON NANOSTRUCTURES
Authors: EISEBITT S LUNING J RUBENSSON JE VANBUUREN T PATITSAS SN TIEDJE T BERGER M ARENSFISCHER R FROHNHOFF S EBERHARDT W
Citation: S. Eisebitt et al., QUANTUM CONFINEMENT EFFECTS IN THE SOFT-X-RAY FLUORESCENCE-SPECTRA OFPOROUS SILICON NANOSTRUCTURES, Solid state communications, 97(7), 1996, pp. 549-552
INFLUENCE OF THE FORMATION CONDITIONS ON THE MICROSTRUCTURE OF POROUSSILICON LAYERS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY
Authors: ROSSOW U FROTSCHER U THONISSEN M BERGER MG FROHNHOFF S MUNDER H RICHTER W
Citation: U. Rossow et al., INFLUENCE OF THE FORMATION CONDITIONS ON THE MICROSTRUCTURE OF POROUSSILICON LAYERS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 255(1-2), 1995, pp. 5-8
FORMATION TECHNIQUES FOR POROUS SILICON SUPERLATTICES
Authors: FROHNHOFF S BERGER MG THONISSEN M DIEKER C VESCAN L MUNDER H LUTH H
Citation: S. Frohnhoff et al., FORMATION TECHNIQUES FOR POROUS SILICON SUPERLATTICES, Thin solid films, 255(1-2), 1995, pp. 59-62
CHARACTERIZATION OF SUPERCRITICALLY DRIED POROUS SILICON
Authors: FROHNHOFF S ARENSFISCHER R HEINRICH T FRICKE J ARNTZEN M THEISS W
Citation: S. Frohnhoff et al., CHARACTERIZATION OF SUPERCRITICALLY DRIED POROUS SILICON, Thin solid films, 255(1-2), 1995, pp. 115-118
ANALYSIS OF THE SURFACES STRUCTURE IN POROUS SI
Authors: SCHOISSWOHL M VONBARDELEBEN HJ MORAZZANI V GROSMAN A ORTEGA C FROHNHOFF S BERGER MG MUNDER H
Citation: M. Schoisswohl et al., ANALYSIS OF THE SURFACES STRUCTURE IN POROUS SI, Thin solid films, 255(1-2), 1995, pp. 123-127
AN EXTENDED QUANTUM MODEL FOR POROUS SILICON FORMATION
Authors: FROHNHOFF S MARSO M BERGER MG THONISSEN M LUTH H MUNDER H
Citation: S. Frohnhoff et al., AN EXTENDED QUANTUM MODEL FOR POROUS SILICON FORMATION, Journal of the Electrochemical Society, 142(2), 1995, pp. 615-620
POROUS SILICON SUPERLATTICES
Authors: FROHNHOFF S BERGER MG
Citation: S. Frohnhoff et Mg. Berger, POROUS SILICON SUPERLATTICES, Advanced materials, 6(12), 1994, pp. 963-965
A NONDESTRUCTIVE STUDY OF THE MICROSCOPIC STRUCTURE OF POROUS SI
Authors: MUNDER H BERGER MG FROHNHOFF S THONISSEN M LUTH H
Citation: H. Munder et al., A NONDESTRUCTIVE STUDY OF THE MICROSCOPIC STRUCTURE OF POROUS SI, Journal of luminescence, 57(1-6), 1993, pp. 5-8
INVESTIGATION OF DIFFERENT OXIDATION PROCESSES FOR POROUS SI BY XPS
Authors: MUNDER H BERGER MG FROHNHOFF S THONISSEN M LUTH H JESKE M SCHULTZE JW
Citation: H. Munder et al., INVESTIGATION OF DIFFERENT OXIDATION PROCESSES FOR POROUS SI BY XPS, Journal of luminescence, 57(1-6), 1993, pp. 223-226
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