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Citation: Tp. Chen et al., DETERMINATION OF LEAKAGE RESISTANCE OF SCHOTTKY CONTACTS BY PHOTOVOLTAGE MEASUREMENTS, Journal of applied physics, 75(11), 1994, pp. 7361-7364
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Citation: Tp. Chen et al., A PHOTOVOLTAIC STUDY OF CURRENT TRANSPORT AND ITS INFLUENCE ON THE DETERMINATION OF THE SCHOTTKY-BARRIER HEIGHT IN SCHOTTKY DIODES, Semiconductor science and technology, 8(12), 1993, pp. 2085-2091
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Authors:
CHEN TP
AU HL
LEE TC
LING CC
BELING CD
FUNG S
Citation: Tp. Chen et al., NUMERICAL STUDY OF THE DECAY OF PHOTOVOLTAGE AT METAL-SEMICONDUCTOR INTERFACES, Solid state communications, 87(12), 1993, pp. 1163-1167
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Authors:
WINNDEEN E
GROSSMAN P
FUNG S
WOO S
CHANG C
BRINSON E
EGGERDING F
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