Citation: S. Bae et al., Characteristics of low-temperature silicon nitride (SiNx : H) using electron cyclotron resonance plasma, SOL ST ELEC, 44(8), 2000, pp. 1355-1360
Authors:
Farber, DG
Bae, S
Okandan, M
Reber, DM
Kuzma, T
Fonash, SJ
Citation: Dg. Farber et al., Pathway to depositing device-quality 50 degrees C silicon nitride in a high-density plasma system, J ELCHEM SO, 146(6), 1999, pp. 2254-2257