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Citation: M. Ebert et al., Investigation and control of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy, PHYS ST S-A, 184(1), 2001, pp. 79-87

Authors: Bell, KA Ebert, M Yoo, SD Flock, K Aspnes, DE

Citation: Ka. Bell et al., Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition, J VAC SCI A, 18(4), 2000, pp. 1184-1189

Authors: Bell, KA Ebert, M Yoo, SD Flock, K Aspnes, DE

Citation: Ka. Bell et al., Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor, J ELEC MAT, 29(1), 2000, pp. 106-111

Authors: Ebert, M Bell, KA Yoo, SD Flock, K Aspnes, DE

Citation: M. Ebert et al., In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy, THIN SOL FI, 364(1-2), 2000, pp. 22-27