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Results: 1-18 |
Results: 18

Authors: Benfatto, M Felici, R Formoso, V
Citation: M. Benfatto et al., Multiple scattering approach to DAFS, J SYNCHROTR, 8, 2001, pp. 396-397

Authors: Papagno, L Chiarello, G Formoso, V Santaniello, A Cupolillo, A Colavita, E
Citation: L. Papagno et al., Electronic structure of the K-(root 3 x root 3)R30 degrees on Al(111) at low and room temperature investigated by angular resolved EELS, SURF SCI, 482, 2001, pp. 675-679

Authors: Formoso, V Filipponi, A Di Cicco, A Chiarello, G Felici, R Santaniello, A
Citation: V. Formoso et al., 1s shake-up excitations in Ge and GeO2 by high-energy x-ray photoemission spectroscopy, PHYS REV B, 61(3), 2000, pp. 1871-1875

Authors: Cappello, G Schmithusen, F Chevrier, J Comin, F Stierle, A Formoso, V de Boissieu, M Boudard, M Lograsso, TA Jenks, C Delaney, D
Citation: G. Cappello et al., Characterization of surface morphologies at the Al-Pd-Mn fivefold surface, MAT SCI E A, 294, 2000, pp. 822-825

Authors: Cappello, G Dechelette, A Schmithusen, F Decossas, S Chevrier, J Comin, F Formoso, V de Boissieu, M Jack, T Colella, R Lograsso, TA Jenks, C
Citation: G. Cappello et al., Bulk and surface evidence for the long-range spatial modulation of X-ray absorption in the Al-Pd-Mn quasicrystal at Bragg incidence, MAT SCI E A, 294, 2000, pp. 863-866

Authors: Stierle, A Formoso, V Comin, F Schmitz, G Franchy, R
Citation: A. Stierle et al., Oxidation of NiAl(100) studied with surface sensitive X-ray diffraction, PHYSICA B, 283(1-3), 2000, pp. 208-211

Authors: Chiarello, G Formoso, V Santaniello, A Colavita, E Papagno, L
Citation: G. Chiarello et al., Surface-plasmon dispersion and multipole surface plasmons in Al(111), PHYS REV B, 62(19), 2000, pp. 12676-12679

Authors: Agostino, RG Liberti, G Formoso, V Colavita, E Zuttel, A Nutzenadel, C Schlapbach, L Santaniello, A Gauthier, C
Citation: Rg. Agostino et al., In situ x-ray absorption study of Zr(V0.29Ni0.71)(3) hydride electrodes, PHYS REV B, 61(20), 2000, pp. 13647-13654

Authors: Stierle, A Formoso, V Comin, F Franchy, R
Citation: A. Stierle et al., Surface X-ray diffraction study ion the initial oxidation of NiAl(100), SURF SCI, 467(1-3), 2000, pp. 85-97

Authors: Jackson, GJ Driver, SM Woodruff, DP Abrams, N Jones, RG Butterfield, MT Crapper, MD Cowie, BCC Formoso, V
Citation: Gj. Jackson et al., A structural study of the interaction of SO2 with Cu(111), SURF SCI, 459(3), 2000, pp. 231-244

Authors: Chiarello, G Cupolillo, A Formoso, V Papagno, L Colavita, E
Citation: G. Chiarello et al., Temperature effects on the coadsorption of K-CO on Ni(100), SURF SCI, 452(1-3), 2000, pp. 133-138

Authors: Jackson, GJ Woodruff, DP Jones, RG Singh, NK Chan, ASY Cowie, BCC Formoso, V
Citation: Gj. Jackson et al., Following local adsorption sites through a surface chemical reaction: CH3SH on Cu(111), PHYS REV L, 84(1), 2000, pp. 119-122

Authors: Le Fevre, P Magnan, H Vogel, J Formoso, V Hricovini, K Chandesris, D
Citation: P. Le Fevre et al., L-3 and M-4,M-5 absorption edges of intermediate valent cerium unravelled by resonant photoemission and resonant Auger spectroscopy, J SYNCHROTR, 6, 1999, pp. 290-292

Authors: Le Fevre, P Magnan, H Hricovini, K Chandesris, D Vogel, J Formoso, V Eickhoff, T Drube, W
Citation: P. Le Fevre et al., Ce electronic structure studied by resonant electron spectroscopies, PHYS ST S-B, 215(1), 1999, pp. 617-623

Authors: Le Fevre, P Magnan, H Vogel, J Formoso, V Hricovini, K Chandesris, D
Citation: P. Le Fevre et al., High energy resonant photoemission and resonant Auger spectroscopy in mixed valent Ce compounds, J ELEC SPEC, 103, 1999, pp. 787-791

Authors: Jackson, GJ Ludecke, J Woodruff, DP Chan, ASY Singh, NK McCombie, J Jones, RG Cowie, BCC Formoso, V
Citation: Gj. Jackson et al., Chemical-shift X-ray standing wave studies: coadsorption site determination of PFx fragments on Ni(111), SURF SCI, 441(2-3), 1999, pp. 515-528

Authors: Calicchia, P Lagomarsino, S Scarinci, F Martinelli, C Formoso, V
Citation: P. Calicchia et al., A study on background subtraction in Auger and photoelectron time coincidence spectroscopy using third generation synchrotron radiation source, REV SCI INS, 70(9), 1999, pp. 3529-3536

Authors: Buttard, D Dolino, G Faivre, C Halimaoui, A Comin, F Formoso, V Ortega, L
Citation: D. Buttard et al., Porous silicon strain during in situ ultrahigh vacuum thermal annealing, J APPL PHYS, 85(10), 1999, pp. 7105-7111
Risultati: 1-18 |