ACNP - Italian Periodicals Catalogue

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Results: 1-22 |

Results: 22

Analytical evaluation of tapping mode atomic force microscopy for chemicalimaging of surfaces

Authors: Basnar, B Friedbacher, G Brunner, H Vallant, T Mayer, U Hoffmann, H

Citation: B. Basnar et al., Analytical evaluation of tapping mode atomic force microscopy for chemicalimaging of surfaces, APPL SURF S, 171(3-4), 2001, pp. 213-225

Influence of the methane concentration on HF-CVD diamond under atmosphericpressure

Authors: Hirakuri, KK Kobayashi, T Nakamura, E Matsukura, N Friedbacher, G Machi, Y

Citation: Kk. Hirakuri et al., Influence of the methane concentration on HF-CVD diamond under atmosphericpressure, VACUUM, 63(3), 2001, pp. 449-454

Surface properties and field emission characteristics of chemical vapor deposition diamond grown on Fe/Si substrates

Authors: Hirakuri, K Yokoyama, T Enomoto, H Mutsukura, N Friedbacher, G

Citation: K. Hirakuri et al., Surface properties and field emission characteristics of chemical vapor deposition diamond grown on Fe/Si substrates, J APPL PHYS, 89(12), 2001, pp. 8253-8258

Integrating an ultramicroelectrode in an AFM cantilever: Combined technology for enhanced information

Authors: Kranz, C Friedbacher, G Mizaikoff, B

Citation: C. Kranz et al., Integrating an ultramicroelectrode in an AFM cantilever: Combined technology for enhanced information, ANALYT CHEM, 73(11), 2001, pp. 2491

Monolayer-controlled deposition of silicon oxide films on gold, silicon, and mica substrates by room-temperature adsorption and oxidation of alkylsiloxane monolayers

Authors: Vallant, T Brunner, H Kattner, J Mayer, U Hoffmann, H Leitner, T Friedbacher, G Schugerl, G Svagera, R Ebel, M

Citation: T. Vallant et al., Monolayer-controlled deposition of silicon oxide films on gold, silicon, and mica substrates by room-temperature adsorption and oxidation of alkylsiloxane monolayers, J PHYS CH B, 104(22), 2000, pp. 5309-5317

Characterization of silicon wafers through deposition of self-assembled monolayers

Authors: Basnar, B Schnoller, J Fottinger, K Friedbacher, G Mayer, U Hoffmann, H Fabry, L

Citation: B. Basnar et al., Characterization of silicon wafers through deposition of self-assembled monolayers, FRESEN J AN, 368(5), 2000, pp. 434-438

Thermal preparation of thin platinum coatings and their electrochemical and atomic force microscopic characterization

Authors: Tammeveski, K Tenno, T Niinisto, J Leitner, T Friedbacher, G Niinisto, L

Citation: K. Tammeveski et al., Thermal preparation of thin platinum coatings and their electrochemical and atomic force microscopic characterization, APPL SURF S, 156(1-4), 2000, pp. 135-142

Quantitative sputter depth profiling of silicon- and aluminium oxynitride films

Authors: Dreer, S Wilhartitz, P Piplits, K Hutter, H Kopnarski, M Friedbacher, G

Citation: S. Dreer et al., Quantitative sputter depth profiling of silicon- and aluminium oxynitride films, MIKROCH ACT, 133(1-4), 2000, pp. 75-87

Atomic force microscopy studies of SnO2 thin film microstructures deposited by atomic layer epitaxy

Authors: Utriainen, M Lattu, H Viirola, H Niinisto, L Resch, R Friedbacher, G

Citation: M. Utriainen et al., Atomic force microscopy studies of SnO2 thin film microstructures deposited by atomic layer epitaxy, MIKROCH ACT, 133(1-4), 2000, pp. 119-123

Fabrication of nanostructured surfaces using self-assembled monolayers

Authors: Basnar, B Madera, M Friedbacher, G Vallant, T Mayer, U Hoffmann, H

Citation: B. Basnar et al., Fabrication of nanostructured surfaces using self-assembled monolayers, MIKROCH ACT, 133(1-4), 2000, pp. 325-329

Investigations of the growth of self-assembled octadecylsiloxane monolayers with atomic force microscopy

Authors: Leitner, T Friedbacher, G Vallant, T Brunner, H Mayer, U Hoffmann, H

Citation: T. Leitner et al., Investigations of the growth of self-assembled octadecylsiloxane monolayers with atomic force microscopy, MIKROCH ACT, 133(1-4), 2000, pp. 331-336

Editorial: Solid State Analysis Proceedings of the 10th Symposium, Vienna,Austria, July 5-7, 1999

Authors: Friedbacher, G Wegscheider, W

Citation: G. Friedbacher et W. Wegscheider, Editorial: Solid State Analysis Proceedings of the 10th Symposium, Vienna,Austria, July 5-7, 1999, MIKROCH ACT, 133(1-4), 2000, pp. V-V

Structural and topographical studies of SILAR-grown highly oriented PbS thin films

Authors: Kanniainen, T Lindroos, S Resch, R Leskela, M Friedbacher, G Grasserbauer, M

Citation: T. Kanniainen et al., Structural and topographical studies of SILAR-grown highly oriented PbS thin films, MATER RES B, 35(7), 2000, pp. 1045-1051

Field-emission properties of diamond grains grown on textured Fe/Si substrates

Authors: Hirakuri, KK Kurata, T Mutsukura, N Friedbacher, G Ohuchi, M

Citation: Kk. Hirakuri et al., Field-emission properties of diamond grains grown on textured Fe/Si substrates, J APPL PHYS, 87(4), 2000, pp. 2026-2030

In-situ atomic force microscopy investigation of aerosols exposed to different humidities

Authors: Kollensperger, G Friedbacher, G Kotzick, R Niessner, R Grasserbauer, M

Citation: G. Kollensperger et al., In-situ atomic force microscopy investigation of aerosols exposed to different humidities, FRESEN J AN, 364(4), 1999, pp. 296-304

Application of atomic force microscopy to particle sizing

Authors: Kollensperger, G Friedbacher, G Krammer, A Grasserbauer, M

Citation: G. Kollensperger et al., Application of atomic force microscopy to particle sizing, FRESEN J AN, 363(4), 1999, pp. 323-332

Substrate effects on the formation of alkylsiloxane monolayers

Authors: Brunner, H Vallant, T Mayer, U Hoffmann, H Basnar, B Vallant, M Friedbacher, G

Citation: H. Brunner et al., Substrate effects on the formation of alkylsiloxane monolayers, LANGMUIR, 15(6), 1999, pp. 1899-1901

In situ and ex situ AFM investigation of the formation of octadecylsiloxane monolayers

Authors: Resch, R Grasserbauer, M Friedbacher, G Vallant, T Brunner, H Mayer, U Hoffmann, H

Citation: R. Resch et al., In situ and ex situ AFM investigation of the formation of octadecylsiloxane monolayers, APPL SURF S, 140(1-2), 1999, pp. 168-175

Statistical evaluation of refractive index, growth rate, hardness and Young's modulus of aluminium oxynitride films

Authors: Dreer, S Krismer, R Wilhartitz, P Friedbacher, G

Citation: S. Dreer et al., Statistical evaluation of refractive index, growth rate, hardness and Young's modulus of aluminium oxynitride films, THIN SOL FI, 354(1-2), 1999, pp. 43-49

Classification of scanning probe microscopies - (Technical report)

Authors: Friedbacher, G Fuchs, H

Citation: G. Friedbacher et H. Fuchs, Classification of scanning probe microscopies - (Technical report), PUR A CHEM, 71(7), 1999, pp. 1337-1357

Quantitative analysis of thin aluminium-oxynitride films by EPMA

Authors: Dreer, S Wilhartitz, P Mersdorf, E Piplits, K Friedbacher, G

Citation: S. Dreer et al., Quantitative analysis of thin aluminium-oxynitride films by EPMA, MIKROCH ACT, 131(3-4), 1999, pp. 211-218

Quantitative analysis of silicon-oxynitride films by EPMA

Authors: Dreer, S Wilhartitz, P Mersdorf, E Friedbacher, G

Citation: S. Dreer et al., Quantitative analysis of silicon-oxynitride films by EPMA, MIKROCH ACT, 130(4), 1999, pp. 281-288

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