Citation: Tw. Kelley et Cd. Frisbie, Gate voltage dependent resistance of a single organic semiconductor grain boundary, J PHYS CH B, 105(20), 2001, pp. 4538-4540
Citation: Ab. Chwang et Cd. Frisbie, Temperature and gate voltage dependent transport across a single organic semiconductor grain boundary, J APPL PHYS, 90(3), 2001, pp. 1342-1349
Authors:
Rang, Z
Haraldsson, A
Kim, DM
Ruden, PP
Nathan, MI
Chesterfield, RJ
Frisbie, CD
Citation: Z. Rang et al., Hydrostatic-pressure dependence of the photoconductivity of single-crystalpentacene and tetracene, APPL PHYS L, 79(17), 2001, pp. 2731-2733
Citation: K. Seshadri et Cd. Frisbie, Potentiometry of an operating organic semiconductor field-effect transistor, APPL PHYS L, 78(7), 2001, pp. 993-995
Citation: Dj. Wold et Cd. Frisbie, Fabrication and characterization of metal-molecule-metal junctions by conducting probe atomic force microscopy, J AM CHEM S, 123(23), 2001, pp. 5549-5556
Citation: Ab. Chwang et Cd. Frisbie, Field effect transport measurements on single grains of sexithiophene: Role of the contacts, J PHYS CH B, 104(51), 2000, pp. 12202-12209
Citation: Tw. Kelley et Cd. Frisbie, Point contact current-voltage measurements on individual organic semiconductor grains by conducting probe atomic force microscopy, J VAC SCI B, 18(2), 2000, pp. 632-635
Citation: Ab. Chwang et al., Fabrication of a sexithiophene semiconducting wire: Nanoshaving with an atomic force microscope tip, ADVAN MATER, 12(4), 2000, pp. 285-288
Citation: H. Skulason et Cd. Frisbie, Rupture of hydrophobic microcontacts in water: Correlation of pull-off force with AFM tip radius, LANGMUIR, 16(15), 2000, pp. 6294-6297
Citation: H. Skulason et Cd. Frisbie, Detection of discrete interactions upon rupture of Au microcontacts to self-assembled monolayers terminated with -S(CO)CH3 or -SH, J AM CHEM S, 122(40), 2000, pp. 9750-9760
Citation: Dj. Wold et Cd. Frisbie, Formation of metal-molecule-metal tunnel junctions: Microcontacts to alkanethiol monolayers with a conducting AFM tip, J AM CHEM S, 122(12), 2000, pp. 2970-2971
Citation: El. Granstrom et Cd. Frisbie, Field effect conductance measurements on thin crystals of sexithiophene, J PHYS CH B, 103(42), 1999, pp. 8842-8849
Citation: Tw. Kelley et al., Conducting probe atomic force microscopy: A characterization tool for molecular electronics, ADVAN MATER, 11(3), 1999, pp. 261