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Authors: LUKYANCHIKOVA NB PETRICHUK MV GARBAR NP SIMOEN E CLAEYS A
Citation: Nb. Lukyanchikova et al., IMPACT OF THE FREE-ELECTRON DISTRIBUTION ON THE RANDOM TELEGRAPH SIGNAL CAPTURE KINETICS IN SUBMICRON N-METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS, Applied physics letters, 73(17), 1998, pp. 2444-2446
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