Citation: Lk. Garling et Gp. Woods, ENHANCING THE ANALYSIS OF VARIANCE (ANOVA) TECHNIQUE WITH GRAPHICAL ANALYSIS AND ITS APPLICATION TO WAFER PROCESSING EQUIPMENT, IEEE transactions on components, packaging, and manufacturing technology. Part A, 17(1), 1994, pp. 149-152
Authors:
NGUYEN CT
KUEHNE SC
WONG SS
GARLING LK
DROWLEY C
Citation: Ct. Nguyen et al., APPLICATION OF SELECTIVE EPITAXIAL SILICON AND CHEMOMECHANICAL POLISHING TO BIPOLAR-TRANSISTORS, I.E.E.E. transactions on electron devices, 41(12), 1994, pp. 2343-2350