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MENDIS SK
KEMENY SE
GEE RC
PAIN B
STALLER CO
KIM QS
FOSSUM ER
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Citation: Tj. Cunningham et al., DEEP CRYOGENIC NOISE AND ELECTRICAL CHARACTERIZATION OF THE COMPLEMENTARY HETEROJUNCTION FIELD-EFFECT TRANSISTOR (CHFET), I.E.E.E. transactions on electron devices, 41(6), 1994, pp. 888-894
Authors:
SEABURY CW
FARLEY CW
MCDERMOTT BT
HIGGINS JA
LIN CL
KIRCHNER PJ
WOODALL JM
GEE RC
Citation: Cw. Seabury et al., BASE RECOMBINATION IN HIGH-PERFORMANCE INGAAS INP HBTS/, I.E.E.E. transactions on electron devices, 40(11), 1993, pp. 2123-2124