Authors:
MUKHOPADHYAY M
RAY SK
GHOSH TB
SREEMANY M
MAITI CK
Citation: M. Mukhopadhyay et al., INTERFACE PROPERTIES OF THIN OXIDE LAYERS GROWN ON STRAINED SIGE LAYERS AT LOW-TEMPERATURES, Semiconductor science and technology, 11(3), 1996, pp. 360-365
Citation: Mn. Islam et al., XPS AND X-RAY-DIFFRACTION STUDIES OF ALUMINUM-DOPED ZINC-OXIDE TRANSPARENT CONDUCTING FILMS, Thin solid films, 280(1-2), 1996, pp. 20-25
Citation: M. Sreemany et Tb. Ghosh, APPLICATION OF RACHINGER METHOD TO SEPARATE OVERLAPPED DOUBLETS IN THE X-RAY PHOTOELECTRON-SPECTRUM, Thin solid films, 280(1-2), 1996, pp. 167-170
Citation: M. Biswas et al., POLYMER ANCHORED METAL-COMPLEXES .4. X-RAY PHOTOELECTRON SPECTROSCOPIC ANALYSIS OF A POLYCONDENSATE FROM CU(II) 1,10-PHENANTHROLINE AND PYROMELLITIC DIANHYDRIDE, Journal of applied polymer science, 61(4), 1996, pp. 719-723
Authors:
SAMANTA B
PAL U
SAMANTARAY BK
GHOSH TB
SHARMA SL
CHAUDHURI AK
Citation: B. Samanta et al., MICROSTRUCTURAL FEATURES OF CD0.8ZN0.2 TE THIN-FILMS STUDIED BY X-RAY-DIFFRACTION AND ELECTRON-MICROSCOPY, Bulletin of Materials Science, 18(1), 1995, pp. 81-91
Citation: M. Sreemany et Tb. Ghosh, ANGLE-RESOLVED XPS STUDY OF INHOMOGENEOUS SPECIMENS OF POLYCRYSTALLINE SILVER COVERED WITH UNIFORM GRAPHITE OVERLAYERS, Applied surface science, 90(2), 1995, pp. 241-250
Citation: Tb. Ghosh et M. Sreemany, ON THE CARBON 1S PHOTOELECTRON-SPECTRUM OF CELLULOSE, Indian Journal of Pure & Applied Physics, 31(12), 1993, pp. 931-935