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Results: 1-12 |
Results: 12
XPS STUDIES ON THE OXIDATION BEHAVIOR OF SIC PARTICLES
Authors: SREEMANY M GHOSH TB PAI BC CHAKRABORTY M
Citation: M. Sreemany et al., XPS STUDIES ON THE OXIDATION BEHAVIOR OF SIC PARTICLES, Materials research bulletin, 33(2), 1998, pp. 189-198
INTERFACE PROPERTIES OF THIN OXIDE LAYERS GROWN ON STRAINED SIGE LAYERS AT LOW-TEMPERATURES
Authors: MUKHOPADHYAY M RAY SK GHOSH TB SREEMANY M MAITI CK
Citation: M. Mukhopadhyay et al., INTERFACE PROPERTIES OF THIN OXIDE LAYERS GROWN ON STRAINED SIGE LAYERS AT LOW-TEMPERATURES, Semiconductor science and technology, 11(3), 1996, pp. 360-365
XPS AND X-RAY-DIFFRACTION STUDIES OF ALUMINUM-DOPED ZINC-OXIDE TRANSPARENT CONDUCTING FILMS
Authors: ISLAM MN GHOSH TB CHOPRA KL ACHARYA HN
Citation: Mn. Islam et al., XPS AND X-RAY-DIFFRACTION STUDIES OF ALUMINUM-DOPED ZINC-OXIDE TRANSPARENT CONDUCTING FILMS, Thin solid films, 280(1-2), 1996, pp. 20-25
APPLICATION OF RACHINGER METHOD TO SEPARATE OVERLAPPED DOUBLETS IN THE X-RAY PHOTOELECTRON-SPECTRUM
Authors: SREEMANY M GHOSH TB
Citation: M. Sreemany et Tb. Ghosh, APPLICATION OF RACHINGER METHOD TO SEPARATE OVERLAPPED DOUBLETS IN THE X-RAY PHOTOELECTRON-SPECTRUM, Thin solid films, 280(1-2), 1996, pp. 167-170
POLYMER ANCHORED METAL-COMPLEXES .4. X-RAY PHOTOELECTRON SPECTROSCOPIC ANALYSIS OF A POLYCONDENSATE FROM CU(II) 1,10-PHENANTHROLINE AND PYROMELLITIC DIANHYDRIDE
Authors: BISWAS M MUKHERJEE A GHOSH TB
Citation: M. Biswas et al., POLYMER ANCHORED METAL-COMPLEXES .4. X-RAY PHOTOELECTRON SPECTROSCOPIC ANALYSIS OF A POLYCONDENSATE FROM CU(II) 1,10-PHENANTHROLINE AND PYROMELLITIC DIANHYDRIDE, Journal of applied polymer science, 61(4), 1996, pp. 719-723
MICROSTRUCTURAL FEATURES OF CD0.8ZN0.2 TE THIN-FILMS STUDIED BY X-RAY-DIFFRACTION AND ELECTRON-MICROSCOPY
Authors: SAMANTA B PAL U SAMANTARAY BK GHOSH TB SHARMA SL CHAUDHURI AK
Citation: B. Samanta et al., MICROSTRUCTURAL FEATURES OF CD0.8ZN0.2 TE THIN-FILMS STUDIED BY X-RAY-DIFFRACTION AND ELECTRON-MICROSCOPY, Bulletin of Materials Science, 18(1), 1995, pp. 81-91
ANGLE-RESOLVED XPS STUDY OF INHOMOGENEOUS SPECIMENS OF POLYCRYSTALLINE SILVER COVERED WITH UNIFORM GRAPHITE OVERLAYERS
Authors: SREEMANY M GHOSH TB
Citation: M. Sreemany et Tb. Ghosh, ANGLE-RESOLVED XPS STUDY OF INHOMOGENEOUS SPECIMENS OF POLYCRYSTALLINE SILVER COVERED WITH UNIFORM GRAPHITE OVERLAYERS, Applied surface science, 90(2), 1995, pp. 241-250
XPS-STUDIES OF GE-DOPED OPTICAL-FIBER PERFORM
Authors: SAHU J BISWAS A GHOSH TB ACHARYA HN
Citation: J. Sahu et al., XPS-STUDIES OF GE-DOPED OPTICAL-FIBER PERFORM, Indian Journal of Pure & Applied Physics, 33(6), 1995, pp. 347-349
LASER-SURFACE ALLOYING OF ALUMINUM ON COPPER SUBSTRATE
Authors: MANNA I ABRAHAM S REDDY G BOSE DN GHOSH TB PABI SK
Citation: I. Manna et al., LASER-SURFACE ALLOYING OF ALUMINUM ON COPPER SUBSTRATE, Scripta metallurgica et materialia, 31(6), 1994, pp. 713-718
ON THE XPS PEAK SHAPE-ANALYSIS
Authors: SREEMANY M GHOSH TB
Citation: M. Sreemany et Tb. Ghosh, ON THE XPS PEAK SHAPE-ANALYSIS, Applied surface science, 81(3), 1994, pp. 365-375
ON THE XPS PEAK SHAPE-ANALYSIS
Authors: SREEMANY M GHOSH TB
Citation: M. Sreemany et Tb. Ghosh, ON THE XPS PEAK SHAPE-ANALYSIS, Applied surface science, 81(3), 1994, pp. 365-375
ON THE CARBON 1S PHOTOELECTRON-SPECTRUM OF CELLULOSE
Authors: GHOSH TB SREEMANY M
Citation: Tb. Ghosh et M. Sreemany, ON THE CARBON 1S PHOTOELECTRON-SPECTRUM OF CELLULOSE, Indian Journal of Pure & Applied Physics, 31(12), 1993, pp. 931-935
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