Authors: GIESSIBL FJ

Citation: Fj. Giessibl, FORCES AND FREQUENCY-SHIFTS IN ATOMIC-RESOLUTION DYNAMIC-FORCE MICROSCOPY, Physical review. B, Condensed matter, 56(24), 1997, pp. 16010-16015

Authors: GIESSIBL FJ TORTONESE M

Citation: Fj. Giessibl et M. Tortonese, SELF-OSCILLATING MODE FOR FREQUENCY-MODULATION NONCONTACT ATOMIC-FORCE MICROSCOPY, Applied physics letters, 70(19), 1997, pp. 2529-2531

Authors: GIESSIBL FJ

Citation: Fj. Giessibl, ATOMIC-RESOLUTION OF THE SILICON (111)-(7X7) SURFACE BY ATOMIC-FORCE MICROSCOPY, Science, 267(5194), 1995, pp. 68-71

Authors: GIESSIBL FJ

Citation: Fj. Giessibl, ATOMIC-FORCE MICROSCOPY IN ULTRAHIGH-VACUUM, JPN J A P 1, 33(6B), 1994, pp. 3726-3734

Authors: GIESSIBL FJ TRAFAS BM

Citation: Fj. Giessibl et Bm. Trafas, PIEZORESISTIVE CANTILEVERS UTILIZED FOR SCANNING TUNNELING AND SCANNING FORCE MICROSCOPE IN ULTRAHIGH-VACUUM, Review of scientific instruments, 65(6), 1994, pp. 1923-1929