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Citation: Rj. Gleixner et Wd. Nix, EFFECT OF BAMBOO GRAIN-BOUNDARIES ON THE MAXIMUM ELECTROMIGRATION-INDUCED STRESS IN MICROELECTRONIC INTERCONNECT LINES, Journal of applied physics, 83(7), 1998, pp. 3595-3599

Authors: CLEMENS BM NIX WD GLEIXNER RJ

Citation: Bm. Clemens et al., VOID NUCLEATION ON A CONTAMINATED PATCH, Journal of materials research, 12(8), 1997, pp. 2038-2042

Authors: GLEIXNER RJ CLEMENS BM NIX WD

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