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Results:
1-7
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Results: 7
Authors:
SCHMITZ B
GEERKENS J
SEIDEL U
GOCH G
Citation: B. Schmitz et al., FUNDAMENTALS OF PHOTOTHERMAL MEASUREMENTS FOR NONDESTRUCTIVE TESTING, TM. Technisches Messen, 65(5), 1998, pp. 177-184
Authors:
GOCH G
SCHMITZ B
REIGL M
Citation: G. Goch et al., APPLICATIONS OF THE FINITE-DIFFERENCES METHOD FOR THE PHOTOTHERMAL MATERIAL INSPECTION, TM. Technisches Messen, 65(11), 1998, pp. 400-406
Authors:
SEIDEL U
LAN TTN
WALTHER HG
SCHMITZ B
GEERKENS J
GOCH G
Citation: U. Seidel et al., QUANTITATIVE CHARACTERIZATION OF MATERIAL INHOMOGENEITIES BY THERMAL WAVES, Optical engineering, 36(2), 1997, pp. 376-390
Authors:
BOLEWSKA K
KOZLOWSKA H
GOCH G
MIKOLAJEK B
BIERZYNSKI A
Citation: K. Bolewska et al., MOLECULAR-CLONING AND EXPRESSION IN ESCHERICHIA-COLI OF A GENE CODINGFOR BOVINE S100A1 PROTEIN AND ITS GLU32-]GLN AND GLU73-]GLN MUTANTS, Acta Biochimica Polonica, 44(2), 1997, pp. 275-283
Authors:
GOCH G
REIGL M
Citation: G. Goch et M. Reigl, APPLICATION OF THE FINITE-ELEMENT METHOD AND THE FINITE-DIFFERENCE METHOD TO PHOTOTHERMAL INSPECTIONS, Journal of applied physics, 79(12), 1996, pp. 9084-9089
Authors:
LAN TTN
SEIDEL U
WALTHER HG
GOCH G
SCHMITZ B
Citation: Ttn. Lan et al., EXPERIMENTAL RESULTS OF PHOTOTHERMAL MICROSTRUCTURAL DEPTH PROFILING, Journal of applied physics, 78(6), 1995, pp. 4108-4111
Authors:
GOCH G
GEERKENS J
REICK M
SCHMITZ B
Citation: G. Goch et al., ANALYSIS OF SURFACE-LAYER VARIATIONS BY PHOTOTHERMAL MEANS, Journal de physique. IV, 4(C7), 1994, pp. 319-322
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