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Citation: Yd. Goncharenko et La. Evseyev, THE USE OF SCANNING ELECTRON-MICROSCOPY, AUGER-ELECTRON SPECTROSCOPY,SECONDARY-ION MASS-SPECTROMETRY FOR INVESTIGATION OF STRUCTURE AND ELEMENTAL COMPOSITION OF THE ELECTROINSULATING COATING, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 62(3), 1998, pp. 496-501

Authors: KAZAKOV VA CHAKIN VP GONCHARENKO YD

Citation: Va. Kazakov et al., TENSILE PROPERTIES AND FRACTURE-BEHAVIOR OF V-CR-TI ALLOYS AFTER NEUTRON-IRRADIATION AT 330-DEGREES-C, Journal of nuclear materials, 263, 1998, pp. 1492-1496

Authors: POKROVSKY AS FABRITSIEV SA BAGAUTDINOV RM GONCHARENKO YD

Citation: As. Pokrovsky et al., HIGH-TEMPERATURE BERYLLIUM EMBRITTLEMENT, Journal of nuclear materials, 237, 1996, pp. 841-846