Citation: B. Gotsmann et al., TIP-SAMPLE INTERACTIONS IN SCANNING FORCE MICROSCOPY USING THE FREQUENCY-MODULATION TECHNIQUE - EXPERIMENTS AND COMPUTER-SIMULATION (VOL 39, PG 153, 1997), Europhysics letters, 41(5), 1998, pp. 583-583
Authors:
SEIDEL C
GOTSMANN B
KOPF H
REIHS K
FUCHS H
Citation: C. Seidel et al., ALUMINUM DEPOSITION ON SF6 PLASMA-TREATED POLYCARBONATE - AN AFM, XPSAND MASS-SPECTROSCOPY STUDY, Surface and interface analysis, 26(4), 1998, pp. 306-315
Citation: B. Gotsmann et al., TIP-SAMPLE INTERACTIONS IN SCANNING FORCE MICROSCOPY USING THE FREQUENCY-MODULATION TECHNIQUE - EXPERIMENTS AND COMPUTER-SIMULATION, Europhysics letters, 39(2), 1997, pp. 153-158