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Results: 26-30/30
Authors:
NAUDON A
GOUDEAU P
HALIMAOUI A
LAMBERT B
BOMCHIL G
Citation: A. Naudon et al., SMALL-ANGLE X-RAY-SCATTERING STUDY OF ANODICALLY OXIDIZED POROUS SILICON LAYERS, Journal of applied physics, 75(2), 1994, pp. 780-784
Authors:
BADAWI KF
DURAND N
GOUDEAU P
PELOSIN V
Citation: Kf. Badawi et al., RESIDUAL-STRESSES AND MICROSTRUCTURE OF AG-NI MULTILAYERS, Applied physics letters, 65(24), 1994, pp. 3075-3077
Authors:
NAUDON A
GOUDEAU P
HALIMAOUI A
BOMCHIL G
Citation: A. Naudon et al., SMALL-ANGLE X-RAY-SCATTERING STUDY OF THE MICROSTRUCTURE OF HIGHLY POROUS SILICON, Journal de physique. IV, 3(C8), 1993, pp. 349-352
Authors:
BADAWI KF
GOUDEAU P
PACAUD J
JAOUEN C
DELAFOND J
NAUDON A
GLADYSZEWSKI G
Citation: Kf. Badawi et al., X-RAY-DIFFRACTION STUDY OF RESIDUAL-STRESS MODIFICATION IN CU W SUPERLATTICES IRRADIATED BY LIGHT AND HEAVY-IONS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 404-407
Authors:
GOUDEAU P
NAUDON A
HALIMAOUI A
BOMCHIL G
Citation: P. Goudeau et al., SAXS STUDY OF THE INFLUENCE OF THE POROUS SILICON MORPHOLOGY ON THE PHOTOLUMINESCENCE EFFICIENCY, Journal of luminescence, 57(1-6), 1993, pp. 141-145