Authors: TEMST K VANBAEL MJ DEGROOT DG KOEMAN NJ GRIESSEN RP WUYTS B VANHAESENDONCK C BRUYNSERAEDE Y

Citation: K. Temst et al., ATOMIC-FORCE MICROSCOPY AND X-RAY-DIFFRACTION STUDY OF SURFACE AND INTERFACE ROUGHNESS IN NB CU MULTILAYERS/, Journal of magnetism and magnetic materials, 156(1-3), 1996, pp. 109-110