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Results: 2
COMPARISON OF DIFFERENT METHODS TO CHARACTERIZE THIN A-SI-H FILMS
Authors:
ESSER HG KARDUCK P RUBEL M ALMQVIST N GROBUSCH L VONSEGGERN J WESCHENFELDER F WIENHOLD P
Citation:
Hg. Esser et al., COMPARISON OF DIFFERENT METHODS TO CHARACTERIZE THIN A-SI-H FILMS, Mikrochimica acta (1966), 1998, pp. 163-170
PROPERTIES OF THIN A-C SI-H COATINGS APPLIED TO TEXTOR/
Authors:
VONSEGGERN J WINTER J GROBUSCH L ESSER HG VIETZKE E WESCHENFELDER F HOLLENSTEIN C KUNZLI H ROSS GG RUBEL M
Citation:
J. Vonseggern et al., PROPERTIES OF THIN A-C SI-H COATINGS APPLIED TO TEXTOR/, Journal of nuclear materials, 222, 1995, pp. 677-681
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