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Results: 1-25/34
Authors:
AKKAL B
BENAMARA Z
BOUDISSA A
BOUIADJRA NB
AMRANI M
BIDEUX L
GRUZZA B
Citation: B. Akkal et al., MODELIZATION AND CHARACTERIZATION OF AU INSB/INP SCHOTTKY SYSTEMS AS A FUNCTION OF TEMPERATURE/, Materials science & engineering. B, Solid-state materials for advanced technology, 55(3), 1998, pp. 162-168
Authors:
ROBERT C
GRUZZA B
BIDEUX L
BONDOT P
Citation: C. Robert et al., A MONTE-CARLO STUDY FOR ELECTRON ELASTIC BACKSCATTERING BASED ON LAYERED MODELS FOR SUBSTRATES, Mathematics and computers in simulation, 47(2-5), 1998, pp. 419-427
Authors:
BIDEUX L
MERLE S
ROBERT C
GRUZZA B
BENAMARRA Z
TIZI S
CHELLALI M
Citation: L. Bideux et al., PASSIVATION OF III-IV COMPOUNDS USED FOR METAL-INSULATOR-INP(100) STRUCTURES, Surface and interface analysis, 26(3), 1998, pp. 177-181
Authors:
BIDEUX L
ROBERT C
MERLE S
GRUZZA B
GOUMET E
GILLAFON E
Citation: L. Bideux et al., SOME APPLICATIONS OF ELASTIC PEAK ELECTRON-SPECTROSCOPY FOR SEMICONDUCTOR SURFACE STUDIES, Surface and interface analysis, 26(12), 1998, pp. 903-907
Authors:
TOTH J
VARGA D
CSERNY I
KOVER L
GRUZZA B
ZEZE D
JARDIN C
GERGELY G
Citation: J. Toth et al., RESOLUTION CORRECTION IN EELS, Vacuum, 50(3-4), 1998, pp. 473-479
Authors:
STARA I
ZUBER S
GRUZZA B
MATOLIN V
Citation: I. Stara et al., EELS INVESTIGATION OF PD THIN-FILM GROWTH ON MB SUBSTRATE, Vacuum, 50(1-2), 1998, pp. 89-91
Authors:
KAPSA R
MATOLIN V
GRUZZA B
Citation: R. Kapsa et al., THE AES AND EELS STUDY OF THIN ALUMINA FILMS DEPOSITED ON NIOBIUM, Vacuum, 50(1-2), 1998, pp. 233-235
Authors:
GRUZZA B
ROBERT C
PEUCHOT B
BIDEUX L
Citation: B. Gruzza et al., ELECTRONS ELASTICALLY BACKSCATTERED FROM AL, AG AND AU SAMPLES, Vacuum, 50(1-2), 1998, pp. 237-242
Authors:
KAPSA R
STARA I
ZEZE D
GRUZZA B
MATOLIN V
Citation: R. Kapsa et al., AES AND EELS STUDY OF ALUMINUM-OXIDE THIN-FILMS, Thin solid films, 317(1-2), 1998, pp. 77-80
Authors:
ROBERT C
BIDEUX L
GRUZZA B
CADORET M
LOHNER T
FRIED M
VAZSONYI E
GERGELY G
Citation: C. Robert et al., SPECTROELLIPSOMETRY AND ELECTRON-SPECTROSCOPY OF POROUS SI THIN-FILMSON P(+) SUBSTRATES, Thin solid films, 317(1-2), 1998, pp. 210-213
Authors:
GRUZZA B
BIDEUX L
MANGAT PS
SOUKIASSIAN P
Citation: B. Gruzza et al., A STUDY OF INP(100) SURFACE PASSIVATION BY ANTIMONY DEPOSITION, Synthetic metals, 90(3), 1997, pp. 223-227
Authors:
BENAMARA Z
TIZI S
CHELLALI M
GRUZZA B
BIDEUX L
ROBERT C
Citation: Z. Benamara et al., ELECTRICAL CHARACTERIZATION OF ALUMINA LAYERS DEPOSITED BY EVAPORATION CELL ON SI AND RESTRUCTURED INP SUBSTRATES, Synthetic metals, 90(3), 1997, pp. 229-232
Authors:
ROBERT C
BIDEUX L
GRUZZA B
LOHNER T
FRIED M
BARNA A
SOMOGYI K
GERGELY G
Citation: C. Robert et al., ELLIPSOMETRY OF AL2O3 THIN-FILMS DEPOSITED ON SI AND INP, Semiconductor science and technology, 12(11), 1997, pp. 1429-1432
Authors:
ROBERT C
BIDEUX L
GRUZZA B
VAZSONYI E
GERGELY G
Citation: C. Robert et al., ELASTIC REFLECTION OF ELECTRONS BY POROUS SILICON LAYERED (PSL) SURFACES - EFFECTS OF POROSITY, Applied surface science, 115(2), 1997, pp. 111-115
Authors:
STARA I
ZEZE D
MATOLIN V
PAVLUCH J
GRUZZA B
Citation: I. Stara et al., AES AND EELS STUDY OF ALUMINA MODEL CATALYST SUPPORTS, Applied surface science, 115(1), 1997, pp. 46-52
Authors:
ZEZE D
BIDEUX L
GRUZZA B
GOLEK F
DANKO D
MROZ S
Citation: D. Zeze et al., RETARDING-FIELD ANALYZER USED IN ELASTIC PEAK ELECTRON-SPECTROSCOPY, Vacuum, 48(3-4), 1997, pp. 399-401
Authors:
BOUSLAMA M
GHAMNIA M
JARDIN C
BOUDERBALA M
GRUZZA B
Citation: M. Bouslama et al., INVESTIGATION BY AES AND EELS OF ZNO INP(100) AND SNO2/AG/, Vacuum, 47(11), 1996, pp. 1353-1359
Authors:
MATOLIN V
NEHASIL V
BIDEUX L
ROBERT C
GRUZZA B
Citation: V. Matolin et al., VACUUM EVAPORATION OF THIN ALUMINA LAYERS, Thin solid films, 289(1-2), 1996, pp. 295-299
Authors:
BIDEUX L
ROBERT C
GRUZZA B
MATOLIN V
BENAMARA Z
Citation: L. Bideux et al., STUDY OF AL2O3 CONDENSATION ON SI(100) AND INP(100) SUBSTRATES, Surface science, 352, 1996, pp. 407-410
Authors:
BENAMARA Z
GRUZZA B
Citation: Z. Benamara et B. Gruzza, PREPARATION AND CHARACTERIZATION OF GERMANIUM SUBSTRATES FOR MIS ELECTRONIC DEVICES, Vacuum, 46(5-6), 1995, pp. 477-480
Authors:
GRUZZA B
BIDEUX L
ROBERT C
SALACE G
VAZSONYI E
PETO G
GUCZI L
GERGELY G
Citation: B. Gruzza et al., INTERDISCIPLINARY SURFACE STUDIES ON POROUS SI(PSI) .1. ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES), VALENCE-BAND XPS AND ATOMIC-FORCE MICROSCOPY (AFM), Vacuum, 46(5-6), 1995, pp. 493-495
Authors:
JARDIN C
GRUZZA B
VAZSONYI E
GERGELY G
Citation: C. Jardin et al., INTERDISCIPLINARY SURFACE STUDIES ON POROUS SILICON (PSI) .2. CATHODOLUMINESCENCE (CL), AUGER (AES), ELECTRON-ENERGY-LOSS (EELS) AND RAMAN-SPECTROSCOPY OF DIFFERENT PSI SAMPLES, Vacuum, 46(5-6), 1995, pp. 497-499
Authors:
GUGLIELMACCI JM
GRUZZA B
Citation: Jm. Guglielmacci et B. Gruzza, INFLUENCE OF THE SUBSTRATE CRYSTALLOGRAPHIC ORIENTATION ON THE AUGER SIGNAL INTENSITY, Vacuum, 46(5-6), 1995, pp. 595-598
Authors:
BOUSLAMA M
GHAMNIA M
GRUZZA B
MILOUA F
JARDIN C
Citation: M. Bouslama et al., AES AND EELS ANALYSIS OF THE INTERACTION BETWEEN PHOSPHORUS AND METALLIC INDIUM, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 377-382
Authors:
PORTE A
GRUZZA B
BONDOT CA
BIDEUX L
JARDIN C
GERGELY G
Citation: A. Porte et al., THE INTERACTION OF HYDROGEN WITH THE INP(100) SUBSTRATES STUDIED BY AES, ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES) AND EELS, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 391-397