Citation: D. Zeze et al., AU, AG AND AG AU SAMPLES, STUDIED USING ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES) AND COMPUTER-SIMULATION/, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 757-762
Citation: Z. Benamara et B. Gruzza, PREPARATION AND ESCA ANALYSIS OF THE GERMANIUM SURFACE - ELECTRICAL CHARACTERIZATION OF THE AL2O3 GE AND AL2O3-GEO2/GE STRUCTURES/, Materials chemistry and physics, 39(1), 1994, pp. 85-89
Authors:
GERGELY G
GRUZZA B
BIDEUX L
BONDOT P
JARDIN C
VAZSONYI E
Citation: G. Gergely et al., ELECTRON-SPECTROSCOPY OF POROUS SILICON LAYERS INDIRECT DETECTION OF HYDROGEN BY ELASTIC PEAK ELECTRON-SPECTROSCOPY, Surface and interface analysis, 22(1-12), 1994, pp. 271-274
Authors:
BONDOT F
PORTE A
GRUZZA B
BIDEUX L
MROZ S
Citation: F. Bondot et al., THE MONTE-CARLO METHOD APPLIED TO THE ELECTRONS ELASTICALLY REFLECTEDBY A COPPER SAMPLE, Vacuum, 45(2-3), 1994, pp. 337-339
Authors:
SOUKIASSIAN P
MANGAT PS
HUTTEL Y
HURYCH Z
GRUZZA B
PORTE A
Citation: P. Soukiassian et al., SB-INDUCED SURFACE STABILIZATION OF INP(100) WAFER BEYOND 500-DEGREES-C, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(4), 1993, pp. 1603-1608
Citation: L. Bideux et al., STRUCTURAL AND ELECTRICAL STUDY OF [AU INP(100)] AND [AU/INSB/INP(100)] SYSTEMS/, Surface and interface analysis, 20(9), 1993, pp. 803-807
Authors:
MANGAT PS
SOUKIASSIAN P
HUTTEL Y
HURYCH Z
GRUZZA B
PORTE A
Citation: Ps. Mangat et al., LOW-ENERGY AR-INDUCED MODIFICATION OF SURFACE ATOMIC BOND LENGTHS ON INP(100) WAFER( ION BOMBARDMENT), Applied physics letters, 63(14), 1993, pp. 1957-1959