Authors: GUGLIELMACCI JM EALET B

Citation: Jm. Guglielmacci et B. Ealet, DETERMINATION OF ALUMINA SURFACE-COMPOSITION BY AUGER-ELECTRON SPECTROSCOPY, Materials science & engineering. B, Solid-state materials for advanced technology, 40(1), 1996, pp. 96-99

Authors: BENHENDA S GUGLIELMACCI JM GILLET M

Citation: S. Benhenda et al., CHARACTERIZATION OF TIN FILMS GROWN BY REACTIVE DC TRIODE SPUTTERING ONTO COPPER SUBSTRATES, Materials science & engineering. B, Solid-state materials for advanced technology, 34(1), 1995, pp. 36-41

Authors: GUGLIELMACCI JM GRUZZA B

Citation: Jm. Guglielmacci et B. Gruzza, INFLUENCE OF THE SUBSTRATE CRYSTALLOGRAPHIC ORIENTATION ON THE AUGER SIGNAL INTENSITY, Vacuum, 46(5-6), 1995, pp. 595-598

Authors: ZEZE D GRUZZA B GUGLIELMACCI JM JARDIN C

Citation: D. Zeze et al., AU, AG AND AG AU SAMPLES, STUDIED USING ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES) AND COMPUTER-SIMULATION/, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 757-762

Authors: RICCI M EALET B GUGLIELMACCI JM GILLET M

Citation: M. Ricci et al., INFLUENCE OF THE ELECTRONIC-STRUCTURE OF AL2O3 SUBSTRATE ON THE GROWTH OF METALLIC AGGREGATES, Zeitschrift fur Physik. D, Atoms, molecules and clusters, 26, 1993, pp. 67-69