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Results: 2
NONLINEAR-ANALYSIS OF THE MORPHOLOGICAL EVOLUTION OF VOID SURFACES INMETALLIC THIN-FILMS UNDER SURFACE ELECTROMIGRATION CONDITIONS
Authors: GUNGOR MR MAROUDAS D
Citation: Mr. Gungor et D. Maroudas, NONLINEAR-ANALYSIS OF THE MORPHOLOGICAL EVOLUTION OF VOID SURFACES INMETALLIC THIN-FILMS UNDER SURFACE ELECTROMIGRATION CONDITIONS, Surface science, 415(3), 1998, pp. 1055-1060
ELECTROMIGRATION-INDUCED FAILURE OF METALLIC THIN-FILMS DUE TO TRANSGRANULAR VOID PROPAGATION
Authors: GUNGOR MR MAROUDAS D
Citation: Mr. Gungor et D. Maroudas, ELECTROMIGRATION-INDUCED FAILURE OF METALLIC THIN-FILMS DUE TO TRANSGRANULAR VOID PROPAGATION, Applied physics letters, 72(26), 1998, pp. 3452-3454
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