Authors:
Gard, FS
Riley, JD
Leckey, R
Usher, BF
Prince, K
Burke, P
Citation: Fs. Gard et al., Quantitative study of thermal diffusion of elements across a ZnSe/GaAs interface using SIMS, SURF REV L, 8(1-2), 2001, pp. 33-42
Citation: Fs. Gard et al., Reflection high-energy electron diffraction (RHEED) study of MBE growth ofZnSe on GaAs(111)B surfaces, APPL SURF S, 181(1-2), 2001, pp. 94-102