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Results: 1-8 |
Results: 8
Neutron diffraction study of phi-Bi8Pb5O17: structure refinement and analysis of cationic ordering
Authors: Righi, L Calestani, G Gemmi, M Migliori, A Bettinelli, M
Citation: L. Righi et al., Neutron diffraction study of phi-Bi8Pb5O17: structure refinement and analysis of cationic ordering, ACT CRYST B, 57, 2001, pp. 237-243
Fermi surface and magnetic structure of TmGa3
Authors: Biasini, M Kontrym-Sznajd, G Monge, MA Gemmi, M Czopnik, A Jura, A
Citation: M. Biasini et al., Fermi surface and magnetic structure of TmGa3, PHYS REV L, 86(20), 2001, pp. 4616-4619
Plasma-enhanced chemical vapour deposition of microcrystalline silicon: onthe dynamics of the amorphous-microcrystalline interface by optical methods
Authors: Summonte, C Rizzoli, R Desalvo, A Zignani, F Centurioni, E Pinghini, R Bruno, G Losurdo, M Capezzuto, P Gemmi, M
Citation: C. Summonte et al., Plasma-enhanced chemical vapour deposition of microcrystalline silicon: onthe dynamics of the amorphous-microcrystalline interface by optical methods, PHIL MAG B, 80(4), 2000, pp. 459-473
Structure determination of phi-Bi8Pb5O17 by electron and powder X-ray diffraction
Authors: Gemmi, M Righi, L Calestani, G Migliori, A Speghini, A Santarosa, M Bettinelli, M
Citation: M. Gemmi et al., Structure determination of phi-Bi8Pb5O17 by electron and powder X-ray diffraction, ULTRAMICROS, 84(3-4), 2000, pp. 133-142
QED V 1.0: a software package for quantitative electron diffraction data treatment
Authors: Belletti, D Calestani, G Gemmi, M Migliori, A
Citation: D. Belletti et al., QED V 1.0: a software package for quantitative electron diffraction data treatment, ULTRAMICROS, 81(2), 2000, pp. 57-65
Very high frequency hydrogen plasma treatment of growing surfaces: a studyof the p-type amorphous to microcrystalline silicon transition
Authors: Summonte, C Rizzoli, R Desalvo, A Zignani, F Centurioni, E Pinghini, R Gemmi, M
Citation: C. Summonte et al., Very high frequency hydrogen plasma treatment of growing surfaces: a studyof the p-type amorphous to microcrystalline silicon transition, J NON-CRYST, 266, 2000, pp. 624-629
Structure determination by electron diffraction and HREM of the incommensurate modulated phase BaxCuO2 (0.67 <= x <= 0.70)
Authors: Migliori, A Gemmi, M Calestani, G Belletti, D Matacotta, FC Dionigi, C Nozar, P
Citation: A. Migliori et al., Structure determination by electron diffraction and HREM of the incommensurate modulated phase BaxCuO2 (0.67 <= x <= 0.70), PHYSICA C, 328(1-2), 1999, pp. 89-103
Structural properties and thermal stability of Bi8Pb5O17 fast ion conducting phases
Authors: Santarosa, M Righi, L Gemmi, M Speghini, A Migliori, A Calestani, G Bettinelli, M
Citation: M. Santarosa et al., Structural properties and thermal stability of Bi8Pb5O17 fast ion conducting phases, J SOL ST CH, 144(2), 1999, pp. 255-262
Risultati: 1-8 |