Authors: Meyne, C Gensch, M Peters, S Pohl, UW Zettler, JT Richter, W

Citation: C. Meyne et al., In situ monitoring of ZnS/GaP and ZnSe/GaAs metalorganic vapor phase epitaxy using reflectance anisotropy spectroscopy and spectroscopic ellipsometry, THIN SOL FI, 364(1-2), 2000, pp. 12-15