Authors: Gobel, T Menzel, S Hecker, M Bruckner, W Wetzig, K Genzel, C

Citation: T. Gobel et al., Stress measurements in thermal loaded (Ti,Al) N hard coatings, SURF COAT, 142, 2001, pp. 861-867

Authors: Genzel, C Stock, C Wallis, B Reimers, W

Citation: C. Genzel et al., The application of white radiation to residual stress analysis in the intermediate zone between surface and volume, NUCL INST A, 467, 2001, pp. 1253-1256

Authors: Genzel, C Reimers, W

Citation: C. Genzel et W. Reimers, Some new aspects in X-ray stress analysis of thin layers, SURF COAT, 119, 1999, pp. 404-409

Authors: Wroblewski, T Clauss, O Crostack, HA Ertel, A Fandrich, F Genzel, C Hradil, K Ternes, W Woldt, E

Citation: T. Wroblewski et al., A new diffractometer for materials science and imaging at HASYLAB beamlineG3, NUCL INST A, 428(2-3), 1999, pp. 570-582

Authors: Genzel, C

Citation: C. Genzel, A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials.I. Theoretical concept, J APPL CRYS, 32, 1999, pp. 770-778

Authors: Genzel, C Broda, M Dantz, D Reimers, W

Citation: C. Genzel et al., A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials.II. Examples, J APPL CRYS, 32, 1999, pp. 779-787