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Citation: Er. Fuoco et al., Surface analysis studies of yield enhancements in secondary ion mass spectrometry by polyatomic projectiles, J PHYS CH B, 105(18), 2001, pp. 3950-3956
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Citation: G. Gillen et al., Negative cesium sputter ion source for generating cluster primary ion beams for secondary ion mass spectrometry analysis, J VAC SCI A, 19(2), 2001, pp. 568-575
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Ramanath, G
Greene, JE
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Citation: G. Ramanath et al., Channeling-induced asymmetric distortion of depth profiles from polycrystalline-TiN/Ti/TiN(001) trilayers during secondary ion mass spectrometry, J VAC SCI B, 18(3), 2000, pp. 1369-1374
Authors:
Gillen, G
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Thompson, P
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Citation: G. Gillen et al., Use of an SF5+ polyatomic primary ion beam for ultrashallow depth profiling on an ion microscope secondary ion mass spectroscopy instrument, J VAC SCI B, 18(1), 2000, pp. 503-508
Citation: G. Gillen, Cognition and occupation in rehabilitation: Cognitive models for intervention in occupational therapy, AM J OCCU T, 54(4), 2000, pp. 446-447
Citation: G. Gillen, Cognitive and perceptual dysfunction: A clinical-reasoning approach to evaluation and intervention, AM J OCCU T, 54(4), 2000, pp. 446-447
Citation: G. Gillen et al., Development of a triplasmatron ion source for the generation of SF5+ and F- primary ion beams on an ion microscope secondary ion mass spectrometry instrument, J VAC SCI A, 17(3), 1999, pp. 845-852
Citation: G. Gillen et al., Synergistic anorectic effect of dehydroepiandrosterone and d-fenfluramine on the obese Zucker rat, PHYSL BEHAV, 67(2), 1999, pp. 173-179