Authors: Sommerhalter, C Sadewasser, S Glatzel, T Matthes, TW Jager-Waldau, A Lux-Steiner, MC

Citation: C. Sommerhalter et al., Kelvin probe force microscopy for the characterization of semiconductor surfaces in chalcopyrite solar cells, SURF SCI, 482, 2001, pp. 1362-1367

Authors: Sommerhalter, C Glatzel, T Matthes, TW Jager-Waldau, A Lux-Steiner, MC

Citation: C. Sommerhalter et al., Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces, APPL SURF S, 157(4), 2000, pp. 263-268

Authors: Sommerhalter, C Matthes, TW Glatzel, T Jager-Waldau, A Lux-Steiner, MC

Citation: C. Sommerhalter et al., High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy, APPL PHYS L, 75(2), 1999, pp. 286-288