Authors: Marka, Z Singh, SK Wang, W Lee, SC Kavich, J Glebov, B Rashkeev, SN Karmarkar, AP Albridge, RG Pantelides, ST Schrimpf, RD Fleetwood, DM Tolk, NH

Citation: Z. Marka et al., Characterization of X-ray radiation damage in Si/SiO2 structures using second-harmonic generation, IEEE NUCL S, 47(6), 2000, pp. 2256-2261