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Results:
1-3
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Results: 3
Level set modeling of transient electromigration grooving
Authors:
Khenner, M Averbuch, A Israeli, M Nathan, M Glickman, E
Citation:
M. Khenner et al., Level set modeling of transient electromigration grooving, COMP MAT SC, 20(2), 2001, pp. 235-250
Creep-controlled electromigration in near-threshold interconnects
Authors:
Glickman, E Nathan, M
Citation:
E. Glickman et M. Nathan, Creep-controlled electromigration in near-threshold interconnects, MICROEL ENG, 50(1-4), 2000, pp. 329-334
Electromigration drift velocity in Cu interconnects modeled with the levelset method
Authors:
Nathan, M Glickman, E Khenner, M Averbuch, A Israeli, M
Citation:
M. Nathan et al., Electromigration drift velocity in Cu interconnects modeled with the levelset method, APPL PHYS L, 77(21), 2000, pp. 3355-3357
Risultati:
1-3
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