Citation: Bm. Goltsman et al., Mobile defect contribution to the dielectric non-linearity of PZT ferroelectric thin films, INTEGR FERR, 32(1-4), 2001, pp. 995-1000
Authors:
Boikov, YA
Goltsman, BM
Yarmarkin, VK
Lemanov, VV
Citation: Ya. Boikov et al., Slow capacitance relaxation in (BaSr)TiO3 thin films due to the oxygen vacancy redistribution, APPL PHYS L, 78(24), 2001, pp. 3866-3868