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Results: 2
Improvement of crystalline quality of 3-inch InP wafers
Authors:
Gondet, S Duffar, T Jacob, G Van Den Bogaert, N Louchet, F
Citation:
S. Gondet et al., Improvement of crystalline quality of 3-inch InP wafers, JPN J A P 1, 38(2B), 1999, pp. 972-976
Thermal stress simulation and interface destabilisation in indium phosphide grown by LEC process
Authors:
Gondet, S Duffar, T Jacob, G Van den Bogaert, N Louchet, F
Citation:
S. Gondet et al., Thermal stress simulation and interface destabilisation in indium phosphide grown by LEC process, J CRYST GR, 199, 1999, pp. 129-134
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