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Zhi, D
Davock, H
Murray, R
Roberts, C
Jones, TS
Pashley, DW
Goodhew, PJ
Joyce, BA
Citation: D. Zhi et al., Quantitative compositional analysis of InAs/GaAs quantum dots by scanning transmission electron microscopy, J APPL PHYS, 89(4), 2001, pp. 2079-2083
Citation: Pj. Goodhew, A model of dislocation blocking and its application to the development of misfit dislocation arrays, PHIL MAG A, 80(9), 2000, pp. 2099-2108
Authors:
Jothilingam, R
Farrell, T
Joyce, TB
Bullough, TJ
Goodhew, PJ
Citation: R. Jothilingam et al., Comparison of in situ optical reflectance and post-growth characterisationfor quantitative composition and thickness determination of AlxGa1-xAs, VACUUM, 53(1-2), 1999, pp. 7-10