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Results: 1-22 |
Results: 22

Authors: Jiang, LN Koo, JM Zeng, SL Mikkelsen, JC Zhang, L Zhou, P Santiago, JG Kenny, TW Goodson, KE Maveety, JG Tran, QA
Citation: Ln. Jiang et al., Two-phase microchannel heat sinks for an electrokinetic VLSI chip cooling system, P IEEE SEM, 2001, pp. 153-157

Authors: McConnell, AD Uma, S Goodson, KE
Citation: Ad. Mcconnell et al., Thermal conductivity of doped polysilicon layers, J MICROEL S, 10(3), 2001, pp. 360-369

Authors: Fletcher, DA Crozier, KB Guarini, KW Minne, SC Kino, GS Quate, CF Goodson, KE
Citation: Da. Fletcher et al., Microfabricated silicon solid immersion lens, J MICROEL S, 10(3), 2001, pp. 450-459

Authors: Uma, S McConnell, AD Asheghi, M Kurabayashi, K Goodson, KE
Citation: S. Uma et al., Temperature-dependent thermal conductivity of undoped polycrystalline silicon layers, INT J THERM, 22(2), 2001, pp. 605-616

Authors: Touzelbaev, MN Goodson, KE
Citation: Mn. Touzelbaev et Ke. Goodson, Impact of experimental timescale and geometry on thin-film thermal property measurements, INT J THERM, 22(1), 2001, pp. 243-263

Authors: Fletcher, DA Goodson, KE Kino, GS
Citation: Da. Fletcher et al., Focusing in microlenses close to a wavelength in diameter, OPTICS LETT, 26(7), 2001, pp. 399-401

Authors: Zhou, P Goodson, KE
Citation: P. Zhou et Ke. Goodson, Subpixel displacement and deformation gradient measurement using digital image/speckle correlation (DISC), OPT ENG, 40(8), 2001, pp. 1613-1620

Authors: Sverdrup, PG Ju, YS Goodson, KE
Citation: Pg. Sverdrup et al., Sub-continuum simulations of heat conduction in silicon-on-insulator transistors, J HEAT TRAN, 123(1), 2001, pp. 130-137

Authors: Touzelbaev, MN Zhou, P Venkatasubramanian, R Goodson, KE
Citation: Mn. Touzelbaev et al., Thermal characterization of Bi2Te3/Sb2Te3 superlattices, J APPL PHYS, 90(2), 2001, pp. 763-767

Authors: King, WP Kenny, TW Goodson, KE Cross, G Despont, M Durig, U Rothuizen, H Binnig, GK Vettiger, P
Citation: Wp. King et al., Atomic force microscope cantilevers for combined thermomechanical data writing and reading, APPL PHYS L, 78(9), 2001, pp. 1300-1302

Authors: Fletcher, DA Crozier, KB Quate, CF Kino, GS Goodson, KE Simanovskii, D Palanker, DV
Citation: Da. Fletcher et al., Refraction contrast imaging with a scanning microlens, APPL PHYS L, 78(23), 2001, pp. 3589-3591

Authors: Sverdrup, PG Sinha, S Asheghi, M Uma, S Goodson, KE
Citation: Pg. Sverdrup et al., Measurement of ballistic phonon conduction near hotspots in silicon, APPL PHYS L, 78(21), 2001, pp. 3331-3333

Authors: Durig, U Cross, G Despont, M Drechsler, U Haberle, W Lutwyche, MI Rothuizen, H Stutz, R Widmer, R Vettiger, P Binnig, GK King, WP Goodson, KE
Citation: U. Durig et al., "Millipede" - an AFM data storage system at the frontier of nanotribology, TRIBOL LETT, 9(1-2), 2000, pp. 25-32

Authors: Fletcher, DA Crozier, KB Quate, CF Kino, GS Goodson, KE Simanovskii, D Palanker, DV
Citation: Da. Fletcher et al., Near-field infrared imaging with a microfabricated solid immersion lens, APPL PHYS L, 77(14), 2000, pp. 2109-2111

Authors: Chui, BW Asheghi, M Ju, YS Goodson, KE Kenny, TW Mamin, HJ
Citation: Bw. Chui et al., Intrinsic-carrier thermal runaway in silicon microcantilevers, MICROSCAL T, 3(3), 1999, pp. 217-228

Authors: Kurabayashi, K Asheghi, M Touzelbaev, M Goodson, KE
Citation: K. Kurabayashi et al., Measurement of the thermal conductivity anisotropy in polyimide films, J MICROEL S, 8(2), 1999, pp. 180-191

Authors: Goodson, KE Ju, YS
Citation: Ke. Goodson et Ys. Ju, Heat conduction in novel electronic films, ANN R MATER, 29, 1999, pp. 261-293

Authors: Ju, YS Kurabayashi, K Goodson, KE
Citation: Ys. Ju et al., Thermal characterization of anisotropic thin dielectric films using harmonic Joule heating, THIN SOL FI, 339(1-2), 1999, pp. 160-164

Authors: Kurabayashi, K Goodson, KE
Citation: K. Kurabayashi et Ke. Goodson, Impact of molecular orientation on thermal conduction in spin-coated polyimide films, J APPL PHYS, 86(4), 1999, pp. 1925-1931

Authors: Ju, YS Goodson, KE
Citation: Ys. Ju et Ke. Goodson, Process-dependent thermal transport properties of silicon-dioxide films deposited using low-pressure chemical vapor deposition, J APPL PHYS, 85(10), 1999, pp. 7130-7134

Authors: Ju, YS Goodson, KE
Citation: Ys. Ju et Ke. Goodson, Phonon scattering in silicon films with thickness of order 100 nm, APPL PHYS L, 74(20), 1999, pp. 3005-3007

Authors: Chaudhari, AM Woudenberg, TM Albin, M Goodson, KE
Citation: Am. Chaudhari et al., Transient liquid crystal thermometry of microfabricated PCR vessel arrays, J MICROEL S, 7(4), 1998, pp. 345-355
Risultati: 1-22 |