Authors:
Gottesman, Y
Rao, EVK
Piot, D
Vergnol, E
Dagens, B
Citation: Y. Gottesman et al., An in-depth analysis of reflections in MMI couplers using optical low-coherence reflectometry: design optimization and performance evaluation, APP PHYS B, 73(5-6), 2001, pp. 609-612
Citation: Y. Gottesman et al., Detection and localization of degradation damaged regions in 1.3 mu m laser diodes on InP using low-coherence reflectometry, MAT SCI E B, 80(1-3), 2001, pp. 236-240
Citation: D. Piot et al., Evaluation of the performance of dual-order mode couplers using optical low-coherence reflectometry, IEEE PHOTON, 12(12), 2000, pp. 1659-1661
Citation: Y. Gottesman et al., A novel design proposal to minimize reflections in deep-ridge multimode interference couplers, IEEE PHOTON, 12(12), 2000, pp. 1662-1664
Authors:
Gottesman, Y
Rao, EVK
Dagens, B
Lovisa, S
Citation: Y. Gottesman et al., Monitoring of multimode imaging devices by use of optical low-coherence reflectometers in reflection and transmission modes, APPL OPTICS, 39(13), 2000, pp. 2140-2144
Authors:
Rao, EVK
Gottesman, Y
Allovon, M
Theys, B
Sik, H
Slempkes, S
Citation: Evk. Rao et al., Hydrogenation of buried passive sections in photonic integrated circuits: a tool to improve propagation losses at similar to 1.56 mu m, MAT SCI E B, 66(1-3), 1999, pp. 50-54