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Citation: Ab. Chwang et al., Fabrication of a sexithiophene semiconducting wire: Nanoshaving with an atomic force microscope tip, ADVAN MATER, 12(4), 2000, pp. 285-288

Authors: Granstrom, EL Frisbie, CD

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Authors: Kelley, TW Granstrom, EL Frisbie, CD

Citation: Tw. Kelley et al., Conducting probe atomic force microscopy: A characterization tool for molecular electronics, ADVAN MATER, 11(3), 1999, pp. 261