Authors: Scherer, M Schwegler, V Seyboth, M Eberhard, F Kirchner, C Kamp, M Ulu, G Unlu, MS Gruhler, R Hollricher, O

Citation: M. Scherer et al., Characterization of etched facets for GaN-based lasers, J CRYST GR, 230(3-4), 2001, pp. 554-557