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Authors:
Gualtieri, AF
Mazzucato, E
Venturelli, P
Viani, A
Zannini, P
Petras, L
Citation: Af. Gualtieri et al., X-ray powder diffraction quantitative analysis performed in situ at high temperature: application to the determination of NiO in ceramic pigments, J APPL CRYS, 32, 1999, pp. 808-813
Citation: Af. Gualtieri et P. Venturelli, In situ study of the goethite-hematite phase transformation by real time synchrotron powder diffraction, AM MINERAL, 84(5-6), 1999, pp. 895-904
Authors:
Gualtieri, AF
Mazzucato, E
Venturelli, P
Viani, A
Zannini, P
Petras, L
Citation: Af. Gualtieri et al., Determination of nickel(II) oxide in ceramic pigments by in situ X-ray diffraction quantitative analysis, J AM CERAM, 82(9), 1999, pp. 2566-2568