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Results: 1-3 |
Results: 3
Effects of rapid thermal treatments on the electrical properties of thin SiO2 gate oxide for DRAM p-channel MOS transistors
Authors: Santucci, S Guerrieri, S Passacantando, M Picozzi, P Fama, F Nardi, N Basile, F
Citation: S. Santucci et al., Effects of rapid thermal treatments on the electrical properties of thin SiO2 gate oxide for DRAM p-channel MOS transistors, J NON-CRYST, 280(1-3), 2001, pp. 54-58
Current and electromagnetic field associated with lightning-return strokesto tall towers
Authors: Rachidi, F Janischewskyj, W Hussein, AM Nucci, CA Guerrieri, S Kordi, B Chang, JS
Citation: F. Rachidi et al., Current and electromagnetic field associated with lightning-return strokesto tall towers, IEEE ELMAGN, 43(3), 2001, pp. 356-367
Influence of corona on the voltages induced by nearby lightning on overhead distribution lines
Authors: Nucci, CA Guerrieri, S de Barros, MTC Rachidi, F
Citation: Ca. Nucci et al., Influence of corona on the voltages induced by nearby lightning on overhead distribution lines, IEEE POW D, 15(4), 2000, pp. 1265-1273
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