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Results: 1-4 |
Results: 4
Atomic-level study of the robustness of the Si(100)-2x1 : H surface following exposure to ambient conditions
Authors: Hersam, MC Guisinger, NP Lyding, JW Thompson, DS Moore, JS
Citation: Mc. Hersam et al., Atomic-level study of the robustness of the Si(100)-2x1 : H surface following exposure to ambient conditions, APPL PHYS L, 78(7), 2001, pp. 886-888
Silicon-based molecular nanotechnology
Authors: Hersam, MC Guisinger, NP Lyding, JW
Citation: Mc. Hersam et al., Silicon-based molecular nanotechnology, NANOTECHNOL, 11(2), 2000, pp. 70-76
Implications of atomic-level manipulation on the Si(100) surface: From enhanced CMOS reliability to molecular nanoelectronics
Authors: Hersam, MC Lee, J Guisinger, NP Lyding, JW
Citation: Mc. Hersam et al., Implications of atomic-level manipulation on the Si(100) surface: From enhanced CMOS reliability to molecular nanoelectronics, SUPERLATT M, 27(5-6), 2000, pp. 583-591
Isolating, imaging, and electrically characterizing individual organic molecules on the Si(100) surface with the scanning tunneling microscope
Authors: Hersam, MC Guisinger, NP Lyding, JW
Citation: Mc. Hersam et al., Isolating, imaging, and electrically characterizing individual organic molecules on the Si(100) surface with the scanning tunneling microscope, J VAC SCI A, 18(4), 2000, pp. 1349-1353
Risultati: 1-4 |