Citation: J. Halim et al., CHARACTERIZATION OF RECAST NAFION FILMS BY SMALL- AND WIDE-ANGLE X-RAY-SCATTERING, Macromolecular chemistry and physics, 195(12), 1994, pp. 3783-3788
Authors:
HALIM J
BUCHI FN
HAAS O
STAMM M
SCHERER GG
Citation: J. Halim et al., CHARACTERIZATION OF PERFLUOROSULFONIC ACID MEMBRANES BY CONDUCTIVITY MEASUREMENTS AND SMALL-ANGLE X-RAY-SCATTERING, Electrochimica acta, 39(8-9), 1994, pp. 1303-1307