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Results: 1-11 |
Results: 11
A SHEAR FORCE FEEDBACK-CONTROL SYSTEM FOR NEAR-FIELD SCANNING OPTICALMICROSCOPES WITHOUT LOCK-IN DETECTION
Authors: HSU JWP MCDANIEL AA HALLEN HD
Citation: Jwp. Hsu et al., A SHEAR FORCE FEEDBACK-CONTROL SYSTEM FOR NEAR-FIELD SCANNING OPTICALMICROSCOPES WITHOUT LOCK-IN DETECTION, Review of scientific instruments, 68(8), 1997, pp. 3093-3095
A VERSATILE STABLE SCANNING PROXIMAL PROBE MICROSCOPE
Authors: JAHNCKE CL HALLEN HD
Citation: Cl. Jahncke et Hd. Hallen, A VERSATILE STABLE SCANNING PROXIMAL PROBE MICROSCOPE, Review of scientific instruments, 68(4), 1997, pp. 1759-1763
OPTICAL IMAGING OF CARRIER DYNAMICS IN SILICON WITH SUBWAVELENGTH RESOLUTION
Authors: LAROSA AH YAKOBSON BI HALLEN HD
Citation: Ah. Larosa et al., OPTICAL IMAGING OF CARRIER DYNAMICS IN SILICON WITH SUBWAVELENGTH RESOLUTION, Applied physics letters, 70(13), 1997, pp. 1656-1658
NANO-RAMAN SPECTROSCOPY AND IMAGING WITH NEAR-FIELD SCANNING OPTICAL MICROSCOPE
Authors: JAHNCKE CL HALLEN HD PAESLER MA
Citation: Cl. Jahncke et al., NANO-RAMAN SPECTROSCOPY AND IMAGING WITH NEAR-FIELD SCANNING OPTICAL MICROSCOPE, Journal of Raman spectroscopy, 27(8), 1996, pp. 579-586
PENETRATION OF LATERALLY QUANTIZED FLUX LAMINA INTO A SUPERCONDUCTINGWIRE NETWORK
Authors: HALLEN HD CHANG AM MILLER R PFEIFFER LN WEST K HESS HF
Citation: Hd. Hallen et al., PENETRATION OF LATERALLY QUANTIZED FLUX LAMINA INTO A SUPERCONDUCTINGWIRE NETWORK, Solid state communications, 99(9), 1996, pp. 651-654
THERMAL OPTICAL EFFECTS IN NSOM PROBES
Authors: YAKOBSON BI LAROSA A HALLEN HD PAESLER MA
Citation: Bi. Yakobson et al., THERMAL OPTICAL EFFECTS IN NSOM PROBES, Ultramicroscopy, 61(1-4), 1995, pp. 179-185
TIME AS A CONTRAST MECHANISM IN NEAR-FIELD IMAGING
Authors: LAROSA A JAHNCKE CL HALLEN HD
Citation: A. Larosa et al., TIME AS A CONTRAST MECHANISM IN NEAR-FIELD IMAGING, Ultramicroscopy, 57(2-3), 1995, pp. 303-308
NEAR-FIELD SCANNING OPTICAL MICROSCOPY AND SPECTROSCOPY FOR SEMICONDUCTOR CHARACTERIZATION
Authors: HALLEN HD LAROSA AH JAHNCKE CL
Citation: Hd. Hallen et al., NEAR-FIELD SCANNING OPTICAL MICROSCOPY AND SPECTROSCOPY FOR SEMICONDUCTOR CHARACTERIZATION, Physica status solidi. a, Applied research, 152(1), 1995, pp. 257-268
ORIGINS AND EFFECTS OF THERMAL-PROCESSES ON NEAR-FIELD OPTICAL PROBES
Authors: LAROSA AH YAKOBSON BI HALLEN HD
Citation: Ah. Larosa et al., ORIGINS AND EFFECTS OF THERMAL-PROCESSES ON NEAR-FIELD OPTICAL PROBES, Applied physics letters, 67(18), 1995, pp. 2597-2599
RAMAN IMAGING WITH NEAR-FIELD SCANNING OPTICAL MICROSCOPY
Authors: JAHNCKE CL PAESLER MA HALLEN HD
Citation: Cl. Jahncke et al., RAMAN IMAGING WITH NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Applied physics letters, 67(17), 1995, pp. 2483-2485
DIRECT SPATIAL IMAGING OF VORTICES IN A SUPERCONDUCTING WIRE NETWORK
Authors: HALLEN HD SESHADRI R CHANG AM MILLER RE PFEIFFER LN WEST KW MURRAY CA HESS HF
Citation: Hd. Hallen et al., DIRECT SPATIAL IMAGING OF VORTICES IN A SUPERCONDUCTING WIRE NETWORK, Physical review letters, 71(18), 1993, pp. 3007-3010
Risultati: 1-11 |