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Authors: SEXTON FW FLEETWOOD DM SHANEYFELT MR DODD PE HASH GL

Citation: Fw. Sexton et al., SINGLE EVENT GATE RUPTURE IN THIN GATE OXIDES, IEEE transactions on nuclear science, 44(6), 1997, pp. 2345-2352

Authors: DODD PE SEXTON FW HASH GL SHANEYFELT MR DRAPER BL FARINO AJ FLORES RS

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Authors: HASH GL SCHWANK JR SHANEYFELT MR SANDOVAL CE CONNORS MP SHERIDAN TJ SEXTON FW SLAYTON EM HEISE JA FOSTER CC

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